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Sensors Expo coming to San Jose

Staff -- Control Engineering, 4/1/2002

San Jose, Calif.— The first of this year's two Sensors Expo events will be held May 21-23 at the San Jose Convention Center. The exhibition and conference will provide some of the latest information on nanotechnology; MEMS/MST/MM; biosensors and bioMEMS; data acquisition and analysis; intelligent systems and smart sensors; sensor technology and design; communications, as well as enabling technologies, such as Internet, networking, and embedded technology.

The keynote address will be given May 21 by Paul Saffo, director of the the Institute for the Future. Conference speakers include Peter Fuhr, Roger Grace, Kang Lee, Strether Smith, Jamie Wiczer, and others.

Exhibitors will include Omron Electronics (Schaumburg, Ill.), which will show its F3C-AL, which has a object detection capability that allows it to detect a 1-mm target from a distance of 700 mm. Its adjustable sensing capability provides for more accurate sensing within a specified range. F3C-AL's low black/white error eliminates the need to reset parameters or change sensors when changing colors, materials, or inclination.

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