Instrumentation: Extech clamp meter transmits readings to Flir IR cameras
Separately, Flir Motion Control Systems delivers new pan-tilt solutions.
Extech Instruments, a Flir company that makes handheld test and measurement tools, introduces the EX845, a 1000 A ac/dc CAT IV clamp meter with Meterlink technology and a built-in infrared thermometer. Meterlink wirelessly connects Flir infrared cameras to Extech meters via Bluetooth to accelerate and simplify inspections.
Flir infrared cameras locate problems with electrical components such as motors, fuses, breaker panels and more. Meterlink makes it easy for a thermographer to take electrical readings and record them on an infrared image.
During inspections, users can transmit key electrical readings such as current or voltage from an Extech EX845 clamp meter directly to a Flir infrared camera using Meterlink, which instantly imprints the electrical readings onto a related infrared image. This not only saves time, but also ensures accurate, coordinated documentation for PdM inspection reports.
The rugged EX845 's advanced True RMS meter functions include ac/dc current, voltage, resistance, capacitance, frequency, infrared and contact temperature, diode-test, and continuity check. The 4-digit, 4,000 count backlit display is complemented by several one-button functions including data hold, min/max, and selectable auto- or manual-ranging.
Pan-tilt motion control
Separately, Flir announced that Directed Perception is now Flir Motion Control Systems. Directed Perception was acquired by Flir Systems in December, 2009. It remains an independent group at the same location in Burlingame, CA, and will continue to develop and enhance its high-performance pan-tilt solutions for any payload and any customer application.
Flir MCS announces new E-Series pan-tilt models that incorporate a 32-bit microcontroller with expanded capabilities and greatly improved performance. Capabilities and features include:
• Higher torque to handle more demanding payloads
• Higher accelerations and top speeds
• Higher command rates, lower latency and jitter
• Web Interface for configuration, control and diagnostics
- Edited by Renee Robbins, senior editor
Control Engineering News Desk
System Integration, Engineering Services news from Control Engineering
Process Control, Advanced Process Control and Instrumentation news from Control Engineering
Machine Control, Motion Control news from Control Engineering