2D optical micrometer

The TM-3000 2D Optical Micrometer from Keyence is designed to combine the functionality of a laser scan micrometer, machine vision system and optical comparator into one device.

12/13/2011


The TM-3000 2D Optical Micrometer is designed to combine the functionality of a laser scan micrometer, machine vision system and optical comparator into a single device. Courtesy: KeyenceThe Keyence TM-3000 2D Optical Micrometer introduces significant technological advancements to 100% automated high-speed, in-line or off-line measurement and inspection applications. The TM-3000 is designed to combine the functionality of a laser scan micrometer, machine vision system and optical comparator into a single device. It is available in three sensor head sizes along with the ability to use 2 transmitter-receiver pairs simultaneously to provide flexibility.

2D micron measurement precision

The 2D Optical Micrometer employs a dual telecentric lens to create uniform collimated light with a green LED. A two dimensional CMOS array then detects the light to dark transitions on the 2D array to measure the dimensions. Certificates of traceability along with calibration certificates are available upon request. High speed and high precision are a result of sub-pixel processing only in the areas or points designated for measurement.

Multi-Point measurement with no target positioning required

Because the system works in two dimensions it can measure up to 16 points within the measurement area. A combination of 15 measurement modes and 8 auxiliary modes can support measurements including, but not limited to, hole diameter, center pitch, intersection point, radius, width, angle, perpendicular distance and area. The position correction function automatically orients the test part prior to measurement, thus increasing accuracy. No longer are expensive positioning mechanisms needed to ensure the best precision. All programming and monitoring can be performed with or without a PC.

Keyence Corporation of America

www.keyence.com 

- Edited by Chris Vavra, Control Engineering, www.controleng.com 

controleng.com/machinevision



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