Data Translation DAQ modules offer high-speed measurement, control
DT9834 Series of 500 Hz USB data acquisition modules from Data Translation Inc. provides simultaneous analog input, analog output, digital I/O, and counter/timer subsystem operation at rates of 500 kSamples/sec.
DT9834 Series of data acquisition modules from Data Translation offers high-speed signal measurement and control.
DT9834 Series of 500 kHz USB data acquisition modules from Data Translation Inc . provides simultaneous analog input, analog output, digital I/O, and counter/timer subsystem operation at rates of 500 kSamples/second. The company claims the Series breaks new ground in test and measurement by combining high-performance PCI functionality with the ease-of-use and high-speed data transfer rate of USB 2.0. Products are intended for applications where dynamic signals need to be measured and controlled precisely and at high speed.
Series offers multiple performance features, including:
True, 16-bit resolution at 500 kHz throughput for precision measurement of dynamic signals;
Full digital I/O for time stamping, pattern recognition and synchronization of external events;
True, 16-bit resolution at 500 kHz high-speed deglitched DACs (digital-to-analog converters) for pure waveform signal generation;
Flexible clocks and triggers for complete control over signal acquisition/generation;
Secondary power connectors for OEM flexible options for embedded solutions; and
Synchronous operations of all subsystems to allow high-speed control loops using analog in/out and counter timer operations simultaneously.
The 16-module Series operates on Microsoft Windows XP/2000 and includes a Data Acquisition Omni CD containing applications that allow users to acquire, generate, and analyze dynamic signals immediately upon set up. Modules can be used in LabView, Visual C++, and Visual Basic.
According to Fred Molinari, president and ceo of Data Translation, “End-users and OEMs can now maximize the plug-and-play capability of USB and take more accurate measurements at speeds rivaling PCI rates.”
—Jeanine Katzel, senior editor, Control Engineering, firstname.lastname@example.org