Emerson releases EDDL whitepaper

Emerson Process Management has published a whitepaper that can help users understand and implement electronic device description language (EDDL) technology.


Emerson Process Management has published a whitepaper that can help users understand and implement electronic device description language (EDDL) technology. In the 12-page paper, 'Digital Fieldbus Installations Use EDDL Technology for Simplicity with Advanced, Full Functionality,' author Martin Zielinski covers the basics of EDDL, recent historical developments, and how EDDL can benefit and be implemented by users today.

EDDL was approved as IEC 61804-2 in March 2004, but the EDD source files created using EDDL were already deployed in millions of process industry field devices, according to the paper. Zielinski explains that EDDL is a text-based language for describing the digital communication characteristics of intelligent field instrumentation and equipment parameters, such as device status, diagnostic data, and configuration details, in an operating system (OS) and human machine interface (HMI) neutral environment.

Initially developed in 1992 for use as part of the HART Communication Protocol, EDDL based-technologies continue to evolve. Zielinski adds that EDDL is being enhanced to extend the concept of interoperability to the HMI and diagnostic data. Today, EDDL technologies form the engineering and operating foundation on which several major digital fieldbus protocols—FOUNDATION™, HART®, and Profibus—construct parametric and device descriptions. And, because EDDL is an open technology with international standard status, it can be easily and effectively applied to any device and any fieldbus protocol.

The EDDL technology enables a Host System manufacturer to create a single engineering environment that can support any device, from any supplier, using any communications protocol, without the need for custom software drivers for each device type.

To read the entire whitepaper, visit the applications/whitepapers section at Control Engineering ’s Resource Center . Registered users click here .

—Jim Montague, news editor, Control Engineering, jmontague@reedbusiness.com

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