Exclusive: slimmer, faster wafer reader
In-Sight 1721 wafer ID reader, available in September, tracks semiconductor wafers through the manufacturing process.
In-Sight 1721 wafer ID reader, available in September, tracks semiconductor wafers through the manufacturing process. It has a slimmer package and twice the speed of its predecessors and maintains mounting and functional compatibility. Advanced image formation technology, OCR, 2-D matrix, and barcode recognition algorithms deliver reliable reading performance on SEMI-standard scribes. It provides very high read rates on wafer marks affected by CMP, edge beads, copper metallization, blue or green nitride coating, and other process effects. It offers flexible mounting options for easy installation on wafer sorters, ion implanters, probers, and other tools. A graphical user interface simplifies set up, and automatic tuning minimizes operator intervention. Built-in network and serial communications connects the reader to other process tools and the fab network.
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