FEI Co. ships electron microscope for nanotechnology R&D, releases new software

FEI Co. has begun shipping its recently introduced scanning/transmission electron microscope (S/TEM), the Titan 80-300.


FEI Co . has begun shipping its recently introduced scanning/transmission electron microscope (S/TEM), the Titan 80-300. Termed the world’s highest-resolution commercially available microscope, the instrument features a new platform dedicated to correction and monochromator technology and powerful sub-Angstrom (atomic scale) imaging and analysis. It reportedly takes microscopy to the level where new discoveries on the structure-property relationships of functional materials become possible.

“The Titan is a significant breakthrough for the nanotechnology era,” said Vahe Sarkissian, FEI’s chairman and chief executive officer. “This new system is the most powerful member of FEI’s fleet of ultra-high S/TEM resolution and focused ion beam (FIB) technologies that deliver enabling tools for researchers, developers, and manufacturers needing greater access to the nanoscale.”

Currently, most ultra-high resolution microscopy is performed at resolutions between one and two Angstroms. However, below one Angstrom materials exhibit different properties and behaviors. The sub-Angstrom imaging of the Titan provides a greatly enhanced ability to observe and characterize materials.

FEI also announced the release of new software and hardware for its Tecnai G2 transmission electron microscope. Tecnai 3.0 software enhances ease of operation; the hardware features Inspect3D Xpress computer-based technology for high-speed 3-D image reconstruction. The system is said to be the only all-digital transmission electron microscope on the market.

—Jeanine Katzel, senior editor, Control Engineering, jkatzel@reedbusiness.com

No comments
The Engineers' Choice Awards highlight some of the best new control, instrumentation and automation products as chosen by...
The System Integrator Giants program lists the top 100 system integrators among companies listed in CFE Media's Global System Integrator Database.
The Engineering Leaders Under 40 program identifies and gives recognition to young engineers who...
This eGuide illustrates solutions, applications and benefits of machine vision systems.
Learn how to increase device reliability in harsh environments and decrease unplanned system downtime.
This eGuide contains a series of articles and videos that considers theoretical and practical; immediate needs and a look into the future.
Big Data and IIoT value; Monitoring Big Data; Robotics safety standards and programming; Learning about PID
Motor specification guidelines; Understanding multivariable control; Improving a safety instrumented system; 2017 Engineers' Choice Award Winners
Selecting the best controller from several viewpoints; System integrator advice for the IIoT; TSN and real-time Ethernet; Questions to ask when selecting a VFD; Action items for an aging PLC/DCS
This digital report will explore several aspects of how IIoT will transform manufacturing in the coming years.
Motion control advances and solutions can help with machine control, automated control on assembly lines, integration of robotics and automation, and machine safety.
This article collection contains several articles on the Industrial Internet of Things (IIoT) and how it is transforming manufacturing.

Find and connect with the most suitable service provider for your unique application. Start searching the Global System Integrator Database Now!

Future of oil and gas projects; Reservoir models; The importance of SCADA to oil and gas
Big Data and bigger solutions; Tablet technologies; SCADA developments
SCADA at the junction, Managing risk through maintenance, Moving at the speed of data
Automation Engineer; Wood Group
System Integrator; Cross Integrated Systems Group
Jose S. Vasquez, Jr.
Fire & Life Safety Engineer; Technip USA Inc.
click me