FEI Co. ships electron microscope for nanotechnology R&D, releases new software

FEI Co. has begun shipping its recently introduced scanning/transmission electron microscope (S/TEM), the Titan 80-300.

08/18/2005


FEI Co . has begun shipping its recently introduced scanning/transmission electron microscope (S/TEM), the Titan 80-300. Termed the world’s highest-resolution commercially available microscope, the instrument features a new platform dedicated to correction and monochromator technology and powerful sub-Angstrom (atomic scale) imaging and analysis. It reportedly takes microscopy to the level where new discoveries on the structure-property relationships of functional materials become possible.

“The Titan is a significant breakthrough for the nanotechnology era,” said Vahe Sarkissian, FEI’s chairman and chief executive officer. “This new system is the most powerful member of FEI’s fleet of ultra-high S/TEM resolution and focused ion beam (FIB) technologies that deliver enabling tools for researchers, developers, and manufacturers needing greater access to the nanoscale.”

Currently, most ultra-high resolution microscopy is performed at resolutions between one and two Angstroms. However, below one Angstrom materials exhibit different properties and behaviors. The sub-Angstrom imaging of the Titan provides a greatly enhanced ability to observe and characterize materials.

FEI also announced the release of new software and hardware for its Tecnai G2 transmission electron microscope. Tecnai 3.0 software enhances ease of operation; the hardware features Inspect3D Xpress computer-based technology for high-speed 3-D image reconstruction. The system is said to be the only all-digital transmission electron microscope on the market.

—Jeanine Katzel, senior editor, Control Engineering, jkatzel@reedbusiness.com





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