Honeywell joins COL association

11/02/2005


Open process simulation software may be more likely after a related standard effort gained support. Honeywell joined membership of the CAPE-OPEN Laboratories Network (COL). COL is a neutral, industry and academic association promoting open interface standards in process simulation software.

CAPE-OPEN compliant interface is an industry standard for software developers. Products that meet this standard are “CO compliant” and can integrate seamlessly with other “CO compliant” applications.

“This membership enhances Honeywell’s UniSi simulation solution because our design, operator training and optimization solutions will allow our customers access to technologies from other providers, as well enabling them to integrate their own technologies into a comprehensive simulation solution” said Rob Eastick, UniSim product manager, Honeywell Process Solutions.

UniSim lets process manufacturers design, test new processes offline, and train employees prior to implementing the process. Once the new process is online, the UniSim solution supports process control and optimization, performance monitoring and business planning. Through COL membership, Honeywell expects its customers to:

  • Decrease time to market. CAPE software providers share the cost of foundation technology (the interface definition), decreasing product time-to-market and lengthening product life cycles;

  • Influence the technology adoption process. CAPE software providers and users, through well-proven collaboration mechanisms, jointly shape CAPE standards that better meet needs, enabling suppliers and users to make sound-and-timely, business-and-technology development decisions based on known and quantified requirements;

  • Network with industry experts;

  • Increase return on investment; and

  • Implement new business models.

— Richard Phelps, senior editor, Control Engineering
richard.phelps@reedbusiness.com





No comments
The Engineers' Choice Awards highlight some of the best new control, instrumentation and automation products as chosen by...
The System Integrator Giants program lists the top 100 system integrators among companies listed in CFE Media's Global System Integrator Database.
The Engineering Leaders Under 40 program identifies and gives recognition to young engineers who...
This eGuide illustrates solutions, applications and benefits of machine vision systems.
Learn how to increase device reliability in harsh environments and decrease unplanned system downtime.
This eGuide contains a series of articles and videos that considers theoretical and practical; immediate needs and a look into the future.
Intelligent, efficient PLC programming: Cost-saving programming languages are available now; Automation system upgrades; Help from the cloud; Improving flow control; System integration tips
Smarter machines require smarter systems; Fixing PID, part 3; Process safety; Hardware and software integration; Legalities: Integrated lean project delivery
Choosing controllers: PLCs, PACs, IPCs, DCS? What's best for your application?; Wireless trends; Design, integration; Manufacturing Day; Product Exclusive
PLCs, robots, and the quest for a single controller; how OEE is key to automation solutions.
This article collection contains several articles on improving the use of PID.
Learn how Industry 4.0 adds supply chain efficiency, optimizes pricing, improves quality, and more.

Find and connect with the most suitable service provider for your unique application. Start searching the Global System Integrator Database Now!

Special report: U.S. natural gas; LNG transport technologies evolve to meet market demand; Understanding new methane regulations; Predictive maintenance for gas pipeline compressors
Cyber security cost-efficient for industrial control systems; Extracting full value from operational data; Managing cyber security risks
Drilling for Big Data: Managing the flow of information; Big data drilldown series: Challenge and opportunity; OT to IT: Creating a circle of improvement; Industry loses best workers, again