IMTS 2006: NC module for machine tool inspection

09/19/2006


Discrete control/machine control

PC-DMIS NC module, the latest extension of the metrology software, runs onboard inspection tasks on various brands of machine tools without needed to transfer a part to a separate inspection station.

Chicago, IL and North Kingstown, RI— New NC module from Wilcox Associates Inc ., a Hexagon Metrology company, is said to expand the capabilities of the traditional machine tool inspection probe, allowing for true onboard inspection with machine tools without the need to transfer a part to a separate inspection station. Demonstrated last week at the International Manufacturing Technology Show in Chicago, the product is the latest brand extension of PC-DMIS 4.1.

The capabilities are applicable to situations when parts are too large or immobile to be conveniently moved to an offline station. Certain checks, then, can be made with PC-DMIS NC without moving the part. In addition, PC-DMIS NC offers automatic work offset and tool offset adjust capabilities allowing intermediate steps in a machining cycle to be checked to ensure offsets are correct before proceeding.

System communicates directly with machine tool controls, in their own language, while offering, says Wilcox, substantially more capability than the built-in macros, including offline programming capability direct from CAD, 3-D inspection routines onboard the machine tool, and analysis tools, statistical process control (SPC), and graphical reporting.

PC-DMIS metrology software provides direct and seamless integration with CAD data, eliminating translation and maintaining the original design intent throughout the measurement process. It includes comprehensive measurement routines for all part types, whether contoured, thin walled, or prismatic, and for all applications from simple complex. PC-DMIS also runs any brand of coordinate measuring machine (CMM).

Search IMTS atop www.controleng.com for related coverage.

—Control Engineering Daily News Desk
Jeanine Katzel , senior editor





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