Instrumentation: 3 electron microscopes to support nanotechnology research


Commercialization of nanotechnology products got a boost recently when a California research institute specified three sophisticated microscopes for nanotechnology research. The instruments will be a resource for more than a dozen major users and other secondary users with federal funded research projects. The first two systems are expected to ship in the first half of 2007; the third is expected in the fourth quarter.

The advanced transmission electron microscopes will become part of the California NanoSystems Institute (CNSI) at UCLA, which will use the equipment for its Electron Imaging Center for NanoMachines core laboratory. The devices, all from FEI Co., include a 300-kV Titan S/TEM (scanning/transmission electron microscope), a second 300-kV Titan optimized for high-resolution structural biology applications, and a 200-kV Tecnai TF20 for high-throughput electron tomographic studies. FEI provides instruments for nanoscale imaging, analysis, and prototyping.

The mission of CNSI is to encourage university/industry collaboration and to enable the rapid commercialization of discoveries in nanosystems. Work at CNSI targets several areas of nanosystems-related research: energy, environment, and nanotoxicology; nanobiotechnology and biomaterials; nanomechanical and nanofluidic systems; and nanoelectronics, phonics, and architectonics.

“Seeing molecules, materials, and molecular machines in three dimensions is critical to nanoscience,” said Hong Zhou, faculty director of the Electron Imaging Center for NanoMachines. “With these microscopes, we will be able to image, characterize, and analyze structures down to the atomic scale delivering valuable three-dimensional structural information for cell biological, molecular, and materials sciences.”

Electron imaging represents very powerful and indispensable modern tools for biologists, nano-materials scientists, and engineers, said the UCLA research group. Cryo-electron cryomicrosopy plays an increasingly important role in determining sub-nanometer-resolution structures of macromolecular complexes or biological nano-machines, it noted. At this resolution, secondary structural elements are readily recognizable and used to build atomic models through integrated modeling approaches.

High-resolution electron tomography and other imaging modalities allow the 3D visualization of internal structures and compositions of novel materials and nano devices at an atomic level, permitting a better understanding of the mechanisms of their action and suggest ways to improve designs, said CNSI officials.

Read more about nanotechnology and electron microscopes from Control Engineering :

Control Engineering Daily News Desk
Edited by Jeanine Katzel,

No comments
The Engineers' Choice Awards highlight some of the best new control, instrumentation and automation products as chosen by...
The System Integrator Giants program lists the top 100 system integrators among companies listed in CFE Media's Global System Integrator Database.
The Engineering Leaders Under 40 program identifies and gives recognition to young engineers who...
This eGuide illustrates solutions, applications and benefits of machine vision systems.
Learn how to increase device reliability in harsh environments and decrease unplanned system downtime.
This eGuide contains a series of articles and videos that considers theoretical and practical; immediate needs and a look into the future.
Make Big Data and Industrial Internet of Things work for you, 2017 Engineers' Choice Finalists, Avoid control design pitfalls, Managing IIoT processes
Engineering Leaders Under 40; System integration improving packaging operation; Process sensing; PID velocity; Cybersecurity and functional safety
Mobile HMI; PID tuning tips; Mechatronics; Intelligent project management; Cybersecurity in Russia; Engineering education; Road to IANA
This article collection contains several articles on the Industrial Internet of Things (IIoT) and how it is transforming manufacturing.

Find and connect with the most suitable service provider for your unique application. Start searching the Global System Integrator Database Now!

SCADA at the junction, Managing risk through maintenance, Moving at the speed of data
Flexible offshore fire protection; Big Data's impact on operations; Bridging the skills gap; Identifying security risks
The digital oilfield: Utilizing Big Data can yield big savings; Virtualization a real solution; Tracking SIS performance
click me