Keithley introduces new test system cards

Cleveland, OH—Keithley Instruments Inc. has introduced two new multi-channel, source-measure test cards with expanded operating ranges for its Model 4500-MTS multi-channel I-V test system.


Cleveland, OH— Keithley Instruments Inc. has introduced two new multi-channel, source-measure test cards with expanded operating ranges for its Model 4500-MTS multi-channel I-V test system. Each Model 4510- and Model 4511-QIVC (Quad I-V card) provides four source-measure channels in each of nine slots of the Model 4500-MTS PCI mainframe, allowing up to 36 I-V measurement channels. Keithley reports that Model 4500-MTS and its QIVCs can make these measurements in a fraction of the time and at a fraction of the cost of a comparable rack-and-stack system.

Model 4500-MTS is used for automated testing in multi-head (multi-DUT) production test en-vironments, such as those involving stress-measure, life testing, and general device characteriza-tion. Typical applications employ its fast source-measure capabilities to generate I-V curves; measure the resistance of DUTs, such as MEMSs and circuit protection diodes; and characterize many other passive and active devices. The system is also useful as a multi-channel power supply for sourcing and measuring voltages or currents during functional test of devices, such as RFICs and photonic ICs. A variety of instruments, from Keithley and other vendors, can interface with the 4500-MTS to complement its I-V and power supply capabilities.

Keithley reports that Model 4500-MTS can solve difficult measurement problems facing manufacturers, who must test multiple devices or multiple channels on one device simultaneously under many different test conditions. In a typical application, a dozen or more devices are loaded into a test fixture, and electrical data is collected at thousands of source-measure test points on each device. The use of multiple rack-and-stack instruments in these applications is very expen-sive, and slows down data collection due to data communications over the GPIB.

Unlike other modular test systems, Model 4500-MTS is optimized for low-noise, high-current sourcing, while maintaining a well-controlled environment for sensitive measurements. It helps reduce manufacturing costs without compromising quality goals or production throughput.

Control Engineering Daily News Desk
Jim Montague, news editor

No comments
The Engineers' Choice Awards highlight some of the best new control, instrumentation and automation products as chosen by...
The System Integrator Giants program lists the top 100 system integrators among companies listed in CFE Media's Global System Integrator Database.
The Engineering Leaders Under 40 program identifies and gives recognition to young engineers who...
This eGuide illustrates solutions, applications and benefits of machine vision systems.
Learn how to increase device reliability in harsh environments and decrease unplanned system downtime.
This eGuide contains a series of articles and videos that considers theoretical and practical; immediate needs and a look into the future.
Make Big Data and Industrial Internet of Things work for you, 2017 Engineers' Choice Finalists, Avoid control design pitfalls, Managing IIoT processes
Engineering Leaders Under 40; System integration improving packaging operation; Process sensing; PID velocity; Cybersecurity and functional safety
Mobile HMI; PID tuning tips; Mechatronics; Intelligent project management; Cybersecurity in Russia; Engineering education; Road to IANA
This article collection contains several articles on the Industrial Internet of Things (IIoT) and how it is transforming manufacturing.

Find and connect with the most suitable service provider for your unique application. Start searching the Global System Integrator Database Now!

SCADA at the junction, Managing risk through maintenance, Moving at the speed of data
Flexible offshore fire protection; Big Data's impact on operations; Bridging the skills gap; Identifying security risks
The digital oilfield: Utilizing Big Data can yield big savings; Virtualization a real solution; Tracking SIS performance
click me