Keithley introduces new test system cards
Cleveland, OH—Keithley Instruments Inc. has introduced two new multi-channel, source-measure test cards with expanded operating ranges for its Model 4500-MTS multi-channel I-V test system.
Cleveland, OH— Keithley Instruments Inc. has introduced two new multi-channel, source-measure test cards with expanded operating ranges for its Model 4500-MTS multi-channel I-V test system. Each Model 4510- and Model 4511-QIVC (Quad I-V card) provides four source-measure channels in each of nine slots of the Model 4500-MTS PCI mainframe, allowing up to 36 I-V measurement channels. Keithley reports that Model 4500-MTS and its QIVCs can make these measurements in a fraction of the time and at a fraction of the cost of a comparable rack-and-stack system.
Model 4500-MTS is used for automated testing in multi-head (multi-DUT) production test en-vironments, such as those involving stress-measure, life testing, and general device characteriza-tion. Typical applications employ its fast source-measure capabilities to generate I-V curves; measure the resistance of DUTs, such as MEMSs and circuit protection diodes; and characterize many other passive and active devices. The system is also useful as a multi-channel power supply for sourcing and measuring voltages or currents during functional test of devices, such as RFICs and photonic ICs. A variety of instruments, from Keithley and other vendors, can interface with the 4500-MTS to complement its I-V and power supply capabilities.
Keithley reports that Model 4500-MTS can solve difficult measurement problems facing manufacturers, who must test multiple devices or multiple channels on one device simultaneously under many different test conditions. In a typical application, a dozen or more devices are loaded into a test fixture, and electrical data is collected at thousands of source-measure test points on each device. The use of multiple rack-and-stack instruments in these applications is very expen-sive, and slows down data collection due to data communications over the GPIB.
Unlike other modular test systems, Model 4500-MTS is optimized for low-noise, high-current sourcing, while maintaining a well-controlled environment for sensitive measurements. It helps reduce manufacturing costs without compromising quality goals or production throughput.
Control Engineering Daily News Desk
Jim Montague, news editor
jmontague@reedbusiness.com
Do you have experience and expertise with the topics mentioned in this content? You should consider contributing to our CFE Media editorial team and getting the recognition you and your company deserve. Click here to start this process.