MapleSim Connector for LabVIEW, NI VeriStand modeling software released

Maplesoft product upgrade extends connectivity to key NI hardware-in-the-loop products.

02/03/2010


Maplesoft recently announced a product upgrade that extends connectivity to key hardware-in-the-loop (HIL) products from National Instruments (NI). In addition to connectivity to NI LabVIEW, which was announced recently, this updated MapleSim add-on also lets users connect to the new NI VeriStandTMproduct, a ready-to-use software environment for configuring real-time testing applications, including HIL test systems. MapleSim Connector for LabVIEW and NI VeriStand modeling software lets users better manage complex engineering models.

The new software integrates MapleSim's rich modeling environment into the popular LabVIEW and NI VeriStand real-time platforms, enhancing these visual development environments with the visual modeling environment of MapleSim. High-performance, high-fidelity MapleSim models are automatically converted to user-code blocks for easy inclusion into LabVIEW VIs and NI VeriStand applications. Model code also is fully optimized for high-speed real-time simulation, allowing users to get the performance needed for HIL testing without sacrificing fidelity.

"Through this collaboration, HIL testing and simulation will become faster and more convenient for our users," said Chris Washington, real-time testing product manager at National Instruments. "MapleSim's high performance, coupled with the connector product's ability to provide real-time simulation, will provide NI customers with powerful and efficient tools to address complex engineering processes."

Users who have already purchased the MapleSim LabVIEW Connector can upgrade to the new MapleSim Connector for LabVIEW and NI VeriStand software at no extra cost. Products are available from the Maplesoft Web Store or by contacting Maplesoft Sales at 1-800-267-6583. For a detailed list of product features, visit www.maplesoft.com/products/toolboxes/labview_connector/ .

- Edited by Renee Robbins, senior editor
Control Engineering News Desk





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