Nanotechnology: Companies team to promote nanoparticle analysis


Hillsboro, OR— Advanced nanoparticle analysis is taking a leap forward thanks to the combined efforts of a hardware and a software firm. FEI Co . and UK-based Malvern Instruments Ltd . have entered into a joint development and marketing program for advanced nanoparticle analysis using Malvern's particle image analysis software on FEI's line of Quanta scanning electron microscopes (SEMs). The result is a particle analysis system that extends current technologies for nanosized particles. The bundled product is expected to be released late this year.

The software is already used on Malvern systems that encompass traditional optical microscopes. They provide rapid data on particle size and morphology, and distribution profiles for quality control and manufacturing applications. Current uses include rationalizing batch-to-batch variation of materials, identifying crystal polymorphisms, and identifying foreign bodies.

"As the size of materials used in product development and manufacturing continues to move from the microscale into the nanoscale, there is an increasing need for characterization tools that move beyond the limits of light microscopy," said Matt Harris, FEI's vice president of worldwide marketing and business development. "This combination of technologies provides a powerful process and quality control tool for a growing number of nano-enabled products that are moving into production."

Interested in this topic? Read this from Control Engineering: " The Amazing World of Nanotechnology "

—Control Engineering Daily News Desk
Jeanine Katzel , senior editor

No comments
The Engineers' Choice Awards highlight some of the best new control, instrumentation and automation products as chosen by...
The System Integrator Giants program lists the top 100 system integrators among companies listed in CFE Media's Global System Integrator Database.
The Engineering Leaders Under 40 program identifies and gives recognition to young engineers who...
This eGuide illustrates solutions, applications and benefits of machine vision systems.
Learn how to increase device reliability in harsh environments and decrease unplanned system downtime.
This eGuide contains a series of articles and videos that considers theoretical and practical; immediate needs and a look into the future.
Robot advances in connectivity, collaboration, and programming; Advanced process control; Industrial wireless developments; Multiplatform system integration
Sensor-to-cloud interoperability; PID and digital control efficiency; Alarm management system design; Automotive industry advances
Make Big Data and Industrial Internet of Things work for you, 2017 Engineers' Choice Finalists, Avoid control design pitfalls, Managing IIoT processes
Motion control advances and solutions can help with machine control, automated control on assembly lines, integration of robotics and automation, and machine safety.
This article collection contains several articles on the Industrial Internet of Things (IIoT) and how it is transforming manufacturing.

Find and connect with the most suitable service provider for your unique application. Start searching the Global System Integrator Database Now!

Big Data and bigger solutions; Tablet technologies; SCADA developments
SCADA at the junction, Managing risk through maintenance, Moving at the speed of data
Flexible offshore fire protection; Big Data's impact on operations; Bridging the skills gap; Identifying security risks
click me