NMW 2005: ifm efector introduces inspection sensor for shapes, contours

Chicago, IL—ifm efector reports that its new inspection sensor, efector dualis, monitors error-proofing applications to provide 100% inspection testing throughout the assembly automation process.

03/09/2005


Chicago, IL— ifm efector reports that its new inspection sensor, efector dualis, monitors error-proofing applications to provide 100% inspection testing throughout the assembly automation process. Through contour evaluation, the sensor monitors applications such as missing part, good part/bad part, correct orientation, and right part/wrong part to detect component defects. ifm efector is exhibiting dualis at National Manufacturing Week 2005 , March 7-10 at McCormick Place.

This compact sensor is used with an infrared light source to provide pass/fail indication. The light source illuminates the component, and the sensor evaluates its silhouette. The detected contour is then compared with the correct preset contour. If the contours match, the component is released for further assembly processes. If the contours do not match, the process is stopped and an LED indicates the fault.

Designed for industrial use, the sensor’s built-in intelligence includes a miniature complimentary metal oxide semiconductor (CMOS) element as its image processor, a digital signal processor (DSP), and integrated electronics in a 42 x 42 mm diecast housing. This sensor can be used with a variety of light sources that measure only 9.2 mm in thickness, making them easy to install in tight applications. In addition, these 24 V dc quick disconnect sensors feature a four-LED output that indicates power, sensor on-line, contour detected and contour not detected.

Control Engineering Daily News Desk
Jim Montague, news editor
jmontague@reedbusiness.com





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