Omron launches F210 vision sensor with 1.4-ms acquisition, measurement algorithms

Schaumburg, IL—Omron Electronics LLC reports that the F210 high-speed vision sensor it introduced on Sept. 2 combines image acquisition as fast as 1.4 ms with advanced measurement algorithms for faster measurement and inspection operations.

09/08/2003


Schaumburg, IL— Omron Electronics LLC reports that the F210 high-speed vision sensor it introduced on Sept. 2 combines image acquisition as fast as 1.4 ms with advanced measurement algorithms for faster measurement and inspection operations. F210 can perform measurement cycles as fast as 3 ms when used with Omron’s F160-S2 double-speed camera.

The system also features Omron’s Quest algorithm for superior OCR/OCV capability, and new Edge Code technology for defect detection, position and location capability. Edge Code defect detector can be used for detecting precise defects of parts on a conveyor, such as scratches on a ceiling surface. OCR/OCV can read and confirm lot codes on pill bottles. Also, a Fine Matching algorithm enables detection of differences between a user-taught model and a live image, including fine defects on labels that less accurate algorithms cannot catch.

F210 also features productivity tools. Its Intelligent Light Source (ILS) controls light source intensity and direction, and can also save settings internally. F210 does internal trending for statistical process control and tolerance monitoring.

F210 is available with two cameras for multi-angle inspections and/or wide-area field of view measurements. The company says that F210 is ideal for packaging inspection applications, especially in high-speed food and drug operations, and in automotive assembly line and part inspection. It can also be used effectively in material handling, pharmaceutical, robotic guidance and electronics applications.

Control Engineering Daily News Desk
Jim Montague, news editor
jmontague@reedbusiness.com





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