Resources: White papers help improve embedded designs

Two new white papers to help embedded system developers create better products more efficiently are available for download. One explores software testing methods and why they are critical for embedded-system developers. The other looks at industrial thermal management challenges for computer hardware designers.

By Control Engineering Staff December 19, 2008

Two new white papers intended to help embedded system developers create better products more efficiently are available for download. One explores software testing methods and why they are critical for embedded-system developers. The other looks at thermal management challenges that wide temperature variations in industrial environments present to computer hardware designers.

“Software development often proves far more expensive than expected,” says Paul Humphreys, a software engineer with LDRA Ltd. in his paper entitled Why Use Software Verification? “Bugs discovered late in the development cycle send costs soaring and risk the integrity and safety of a system,” he says. The paper, available for download from the Control Engineering Resource Center goes on to discuss the rigorous standards employed for mission-critical software in the aerospace and automotive industries, and shows how these can be employed in general embedded-system software development.

Moxa says it has launched a new marketing campaign that highlights the importance of “wide temperature” products in industrial embedded computing. Industrial computers are often designed to operate reliably in temperatures ranging from -40

To help embedded-hardware developers understand and cope with the challenges of using embedded computers in wide-temperature environments, the company has produced a white paper and PowerPoint presentation that engineers can download free of charge from it’s Website . The white paper highlights the key elements of embedded computers with the wide-temperature feature, and describes techniques Moxa uses to overcomes these design challenges.

C.G. Masi , senior editor
Control Engineering News Desk
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