Sensors Expo 2006: Reflective sensor matches, sorts by color

Rosemont, IL and Carrollton, TX·A reflective sensor that sorts or matches surfaces by color is among latest offerings from TT electronics Optek Technology. Introduced at Sensors Expo 2006 last week in Rosemont (Chicago), IL, OPB780 reflective color sensing assembly is designed for photometric applications.

06/13/2006


Process Control

Among products introduced at last week's Sensor Expo is a small footprint, reflective sensor assembly from TT electronics Optek Technology that sorts or matches surfaces by color.

Rosemont, IL and Carrollton, TX —A reflective sensor that sorts or matches surfaces by color is among latest offerings from TT electronics Optek Technology . Introduced at Sensors Expo 2006 last week in Rosemont (Chicago), IL, OPB780 reflective color sensing assembly is designed for photometric applications. It provides high-resolution digital measurement of the red, green, and blue components of light reflected from the surface being sensed. A small footprint (1.08 x 0.843 x 0.355-in.) makes it well suited for confined spaces.

Sensor is also applicable in pharmaceutical applications (such as pill sorting machinery) and works well for color-match sensing in paint, textile, and cosmetic manufacturing. The assembly's white LED illuminates the surface of the object or liquid being sensed, with the reflected light then received by an 8 x 8 photodiode array. The array consists of 4 selectable groups of red-, green-, blue-, and clear-filtered photodiodes. A light-to-frequency converter in the CMOS monolithic sensor lets the assembly communicate directly with a micro-controller.

OPB780 Series operates from a 5-V power supply and has a typical non-linearity error of 0.2% at 50 kHz. The LED has a typically luminous intensity of 1100 mcd and a typical forward voltage of 3.6 V. Plastic housing can be mounted to a printed circuit board or flush mounted to a surface with clips. Its maximum operating temperature range is -30 to 85 °C.

Control Engineering Daily News Desk
Jeanine Katzel , senior editor





No comments
The Engineers' Choice Awards highlight some of the best new control, instrumentation and automation products as chosen by...
The System Integrator Giants program lists the top 100 system integrators among companies listed in CFE Media's Global System Integrator Database.
The Engineering Leaders Under 40 program identifies and gives recognition to young engineers who...
This eGuide illustrates solutions, applications and benefits of machine vision systems.
Learn how to increase device reliability in harsh environments and decrease unplanned system downtime.
This eGuide contains a series of articles and videos that considers theoretical and practical; immediate needs and a look into the future.
Intelligent, efficient PLC programming: Cost-saving programming languages are available now; Automation system upgrades; Help from the cloud; Improving flow control; System integration tips
Smarter machines require smarter systems; Fixing PID, part 3; Process safety; Hardware and software integration; Legalities: Integrated lean project delivery
Choosing controllers: PLCs, PACs, IPCs, DCS? What's best for your application?; Wireless trends; Design, integration; Manufacturing Day; Product Exclusive
PLCs, robots, and the quest for a single controller; how OEE is key to automation solutions.
This article collection contains several articles on improving the use of PID.
Learn how Industry 4.0 adds supply chain efficiency, optimizes pricing, improves quality, and more.

Find and connect with the most suitable service provider for your unique application. Start searching the Global System Integrator Database Now!

Special report: U.S. natural gas; LNG transport technologies evolve to meet market demand; Understanding new methane regulations; Predictive maintenance for gas pipeline compressors
Cyber security cost-efficient for industrial control systems; Extracting full value from operational data; Managing cyber security risks
Drilling for Big Data: Managing the flow of information; Big data drilldown series: Challenge and opportunity; OT to IT: Creating a circle of improvement; Industry loses best workers, again