Sick introduces distance measurement sensors

Cleveland, OH—To offer higher resolution and more useful features, Sick recently launched its new DME 5000 line of laser distance measurement sensors.

04/13/2004


Cleveland, OH— To offer higher resolution and more useful features, Sick recently launched its new DME 5000 line of laser distance measurement sensors. DME 5000 reportedly provides high accuracy and repeatability, as well as exceptionally quick response times. Sick reports that these char-acteristics make its distance sensors ideal for use in automated storage and retrieval systems (ASRS); horizontal and vertical po-sitioning of cranes; linear positioning of rail or transfer cars; and in other applications where precise distance measurement is required.

DME 5000 consists of a series of reflex/retro-reflective distance measurement sensors. Short-range, mid-range and long-range versions are available. The short-range sensor measures distances up to 70 meters with 0.05 mm resolution and 0.5 mm repeatability. The mid-range sensor accurately measures distances up to 150 meters with 0.05 mm resolution and 1 mm repeatability. The long-range sensor accurately measures distances up to 300 meters with 0.05 mm resolution and 2 mm repeatability.

Multiple data transmission protocols are available including RS 422, SSI, DeviceNet and Profibus.

In addition, DME 5000’s illuminated LCD display shows vital information on one screen, making it easy to view system status. Users can monitor measured distance, signal strength, input/output status, data transfer, contamination, temperature, early warnings, and plausibility indicators during initial setup and during ongoing operations.

DME 5000 has an Encoder Profile option for seamless integration with encoder systems. It also has two programmable, discrete, multi-function input/outputs. The input can be used to program and trigger special features on the device. The output can be easily programmed to give a high or low output, depending on variables such as distance, over/under temperature, or contamination.

Control Engineering Daily News Desk
Jim Montague, news editor
jmontague@reedbuysiness.com





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