Software: Anticipate calibration with wear trend analysis


Software, machine, asset management

PQ Systems suggests wear-trend analysis and failure prediction is possible with Gagepack 7.5 software for calibration data.

Dayton, OH —Wear-trend analysis, seen as critical to assuring accuracy in measurement systems, is among new features in Gagepack 7.5 software. Custom toolbars and a new 'stop-the-clock' approach for individual gages are among new features. The program offers enhanced capabilities for meeting customers' measurement systems requirements and conforming to standards.

Wear-trend analysis can be performed on any gage that has sufficient calibration results, according to Jeff Aughton, project manager for Gagepack. Chart preference allows a user to select the last 3-10 calibrations for the analysis. Calculations are performed and reported for every calibration step defined for the gage. Gagepack will display a chart indicating which step is most likely to go out of calibration first (the 'worst' step). 'This feature gives vital information that helps a user anticipate calibration needs soon enough to take action,' Aughton says. Enhanced customization potential gives users even greater control, he suggests.

Icons are available to support customization of the toolbar; a user has total control over which ones appear, and the order. Custom inquiries have been added to the 'Import Gagepack objects' dialogue box. A 'stop the clock' function for checked-in gages has been available in Gagepack at the database level. This functionality has been moved to the individual gage level, eliminating the need for accessing separate databases, and streamlining the process of gage management. Gagepack will support more than 50 types of barcodes, including all the popular formats (EAN, UPC, Code-128, etc.).

Customers with current maintenance agreements will receive the new release as a part of their contracts. The program can be downloaded for a 30-day free trial, company says

—Control Engineering Daily News Desk
Edited by Mark T. Hoske , editor in chief

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