CMOS X-Ray detector for non-destructive testing applications

Teledyne Dalsa's Rad-icon 2022 CMOS X-Ray detector features 2,064 x 2,236 pixel resolution, an active area of 20.4 x 22.1 cm and 99 micron pixel size and are designed for industrial x-ray inspection and scientific imaging as well as non-destructive testing applications.
By Teledyne Dalsa July 15, 2015

Teledyne Dalsa's Rad-icon 2022 CMOS X-Ray detector features 2064 x 2236 pixel resolution, an active area of 20.4 x 22.1 cm and 99 micron pixel size and are designed for industrial x-ray inspection and scientific imaging as well as non-destructive testingTeledyne Dalsa’s Rad-icon 2022 CMOS X-Ray detector features 2,064 x 2,236 pixel resolution, an active area of 20.4 x 22.1 cm and 99 micron pixel size. Rad-icon detectors deliver real-time imaging of up to 30 frames per second (fps), high sensitivity, and high resolution in a large area device that is integrated and available with a Gigabit Ethernet or camera link interface. The Rad-icon detectors are designed for industrial x-ray inspection and scientific imaging. They are also designed for non-destructive testing applications including weld inspection, wire bond, and printed circuit board (PCB) inspection, microfocus systems, computed tomography (CT) and other demanding industrial imaging applications. Rad-icon digital x-ray detectors leverage CMOS image sensing technology and have an energy range from 10 to 225 kV. Other features include 14-bit digitzation of images as well as SDKs, drivers, and programming support.

Teledyne Dalsa

www.teledynedalsa.com 

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