Events worth noting: Asset management, batch manufacturing
Two upcoming process-control-related events worth noting on the calendar include an educational conference focused on better plant asset management and an exhibition devoted solely to batch manufacturing.
Two upcoming process-control-related events worth noting on the calendar include an educational conference focused on better plant asset management and an exhibition devoted solely to batch manufacturing. Details and registration information on both of them are included in the summaries that follow.
Invensys and Microsoft Plant Intelligence Conference, hosted by Wonderware , is scheduled for a number of North American locations in March and April. This free educational conference is directed at senior-level manufacturing professionals seeking to better utilize their plant assets through improved efficiency and performance, reduced production costs, and improved returns on capital investments. Sessions concentrate on sharing examples of how others have solved overall plant, equipment and performance challenges using Invensys’ Wonderware solutions and Microsoft technology. Click here for more information and to register .
Automation systems security, data exchange standards and achieving better business results through better control are among the topics on the agenda of this year’s World Batch Forum (WBF) North American Conference scheduled for May 16-19 in the Chicago area. The confer-ence is the only major industry gathering dedicated to batch manufacturing. It is intended to provide a forum for batch professionals to share their knowledge and advance the interests of batch manufacturers. Program includes a special session on complying with USA and EU regulations for food, drug, and chemical safety, plus presentations on recent work in ERP-to-MES integration based on the XML schema standards developed by WBF. A Sponsors Exhibition gives attendees a chance to see the latest in batch automation technologies and converse with vendors. For more information and to register, click here .
—Jeanine Katzel, Senior Editor, Control Engineering, firstname.lastname@example.org