Field device tool: Knowledge spreads in seminars, standards meetings
Peachtree City, GA, and Research Triangle Park, NC —The FDT Technology Seminar Series launches in Calgary, Alberta, Canada, and in Houston, TX, on Tuesday, Sept. 18,
The FTD Group will discuss the advantages of and news about FDT (field device tool) technology in a forum to exchange and discuss application information about the technology of ISA SP-103 (Separately, ISA plans an ISA-SP103, Field Device Tool Interface Specification meeting at EXPO 2007 in Houston, TX, on Oct. 2.)
The FDT Group events targets automation professionals, system integrators, and engineering contractors who want to learn about the technology. User presentations will offer a chance to learn about the many applications in process and factory automation. Meeting sponsors include leading automation companies such as ABB, Endress+Hauser, Invensys, MTL, Pepperl+Fuchs, Rockwell Automation, Turck, and Yokogawa.
In related news, the FDT Group held its third User Forum on June 28, 2007, in the Congress Center of Basel, Switzerland. The forum is a platform where users and suppliers exchange practical experience in implementing the FDT technology in their process plants and give feedback to the FDT Group about requirements and priorities for technology enhancements. This was the first time that a FDT User Forum took place in German language, with more than 70 participants and 30 end users.nhanced with tests for FOUNDATION fieldbus, Interbus, and DeviceNet. Interoperability was the focus of workshops and tests over the year, and a project group started working on use cases for Frame certification.
Separately, in June, ISA-SP104 committee completed adoption as an American National Standard of the generic electronic device description language (EDDL) specified by IEC 61804 for device integration. It’s covered in ANSI/ISA-61804-3 (104.00.01)-2007, Function Blocks (FB) for Process Control – Part 3: Electronic Device Description Language (EDDL).
Read more from Control Engineering on “ The Language of Device Integration .”
—Edited by Barb Axelson , contributing editor, and Mark T. Hoske editor in chief
Control Engineering Weekly News
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