Interphex 2005: Photos from the show floor
New York, NY—Thousands of useful solutions from hundreds of exhibitors were featured at Interphex 2005, April 26-28, at the Jacob K. Javits Convention Center. Here’s a brief look at some of the most interesting exhibits and solutions.
New York, NY— Thousands of useful solutions from hundreds of exhibitors were featured at Interphex 2005 , April 26-28, at the Jacob K. Javits Convention Center. Here’s a look at some of the most interesting exhibits and solutions:
| Robert Bristow, Honeywell Process Solutions’ product manager, adjusts Experion PKS R300’s Series C optionally redundant process input-output (I/O) hardware, which uses a new vertical design to deliver wiring, maintenance, and cost savings. |
| Mazazumi Motomura (left) takes a shot at the hoop at Johnson Controls exhibit, while Gregory Weddle (right), Johnson’s global manager for critical environments, collects the rebounds. |
| Lauren Marsden (left), Emerson Process Controls’ sales support engineer, and Michelle Adkins (right), senior principal engineer, demonstrate Emerson’s AMS suite intelligent device manager to a visitor at Interphex 2005. |
| Weed Instruments’ senior VP, Joe Cheatham (right) shows his firm’s non-intrusive, clean-in-place temperature sensor for piping systems to Steven Dudish (left), Glatt Air Technologies’ product manager. |
| Tim Donaldson, Iconics’ marketing director, sets up a video demonstration of Iconics’ BizViz manufacturing intelligence software for the regulated industries. |
| Mike Barber, one of Krohne’s direct sales representatives, adjusts the chemical feed demonstration of Krohne’s new Optimass solution for low-flow applications. |
| Frank Koditek, Belden CDT Electronics Division’s marketing manager, shows some features of Belden’s industrial Ethernet cables to Patricia Saito-Carvallo, Belden’s marketing specialist. |
| Tim Wortley, GE Sensing’s global product manager for pharmaceuticals, demonstrates how GE’s Kaye Validator IMTS immediately indicates what substances can be found and analyzed using the device and the system’s sample strip. |
Control Engineering Daily News Desk
Jim Montague, news editor
jmontague@reedbusiness.com
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