Measurement interface platforms add embedded processing

Measurement interface platforms add embedded processing

National Instruments offers stand-alone processing with its Compact RIO and Compact DAQ platforms. Videos: Concepts behind the platforms, and a demonstration of matching platform with data characteristics.

08/21/2012

National Instruments has announced the new stand-alone NI CompactDAQ system, a high-performance embedded measurement and logging platform with a built-in dual-core Intel processor for running data acquisition, online analysis, and logging software. With the new platform, engineers can customize a complete measurement system using LabVIEW or take advantage of over 600 companies in the NI Alliance Partner Network for a custom turnkey data-logging solution.

This new offering parallels NI’s existing companion product, CompactRIO, that is designed to perform similar functions in addition to high-speed, reliable control.

The CompactDAQ system features:

Intel Core i7 dual-core processor, 2 GB RAM and 32 GB nonvolatile storage to support high-performance, mixed-measurement tests while logging data directly to the system, removing the need for an external PC.

Compatible with LabVIEW 2012 which provides sample projects and templates for high-speed acquisition and data logging, designed to save time and lower maintenance costs.

8-slot chassis with more than 50 C Series I/O module options including AI, AO, DIO, and CAN to create custom measurement and logging systems. I/O modules can work with either the RIO or DAQ platform.

USB, Ethernet, and serial ports, including the new NI cDAQ-9184 Ethernet chassis, to expand the number of module slots for large-channel-count applications or integrate other devices, such as a camera or GPS device.

Above: Brett Burger, senior product marketing manager, explains the concepts between the CompactRIO and CompactDAQ platforms.
Below: Jim Schwartz, product marketing engineer, discusses how the two platforms are used in a Smart Car application demonstration.

Edited by Peter Welander, pwelander@cfemedia.com

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