Keithley introduces new test system cards

Cleveland, OH—Keithley Instruments Inc. has introduced two new multi-channel, source-measure test cards with expanded operating ranges for its Model 4500-MTS multi-channel I-V test system.

12/30/2003


Cleveland, OH— Keithley Instruments Inc. has introduced two new multi-channel, source-measure test cards with expanded operating ranges for its Model 4500-MTS multi-channel I-V test system. Each Model 4510- and Model 4511-QIVC (Quad I-V card) provides four source-measure channels in each of nine slots of the Model 4500-MTS PCI mainframe, allowing up to 36 I-V measurement channels. Keithley reports that Model 4500-MTS and its QIVCs can make these measurements in a fraction of the time and at a fraction of the cost of a comparable rack-and-stack system.

Model 4500-MTS is used for automated testing in multi-head (multi-DUT) production test en-vironments, such as those involving stress-measure, life testing, and general device characteriza-tion. Typical applications employ its fast source-measure capabilities to generate I-V curves; measure the resistance of DUTs, such as MEMSs and circuit protection diodes; and characterize many other passive and active devices. The system is also useful as a multi-channel power supply for sourcing and measuring voltages or currents during functional test of devices, such as RFICs and photonic ICs. A variety of instruments, from Keithley and other vendors, can interface with the 4500-MTS to complement its I-V and power supply capabilities.

Keithley reports that Model 4500-MTS can solve difficult measurement problems facing manufacturers, who must test multiple devices or multiple channels on one device simultaneously under many different test conditions. In a typical application, a dozen or more devices are loaded into a test fixture, and electrical data is collected at thousands of source-measure test points on each device. The use of multiple rack-and-stack instruments in these applications is very expen-sive, and slows down data collection due to data communications over the GPIB.

Unlike other modular test systems, Model 4500-MTS is optimized for low-noise, high-current sourcing, while maintaining a well-controlled environment for sensitive measurements. It helps reduce manufacturing costs without compromising quality goals or production throughput.

Control Engineering Daily News Desk
Jim Montague, news editor
jmontague@reedbusiness.com





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