Ethernet Alliance participating in IEC's DesignCon 2006

01/30/2006


Chicago, IL — The newly-formed Ethernet Alliance is displaying the latest Ethernet developments at the International Engineering Consortium's (IEC) DesignCon 2006 in Silicon Valley's Santa Clara Convention Center from February 6-9.

"The Ethernet Alliance is delighted to be a sponsor of DesignCon," said Blaine Kohl, vice president marketing, Ethernet Alliance. "Like IEC's DesignCon, the Ethernet Alliance's goal is to educate Ethernet users on the technology's many new applications and possibilities. Our mutual goals of exposing designers to the latest technology information make the Ethernet Alliance's participation a natural fit."

Notable elements include:

  • A technical panel, "The Impact of the Ethernet Ecosystem on Backplane and System Design," addressing backplane design and board fabrication, advanced signal conditioning, overall capacity forecasts, power requirements and integrity, and more;

  • Another panel session, part of a first-ever management forum entitled, "The Need for 100G Ethernet," will address areas such as features required of next-generation devices in order to support terabit-scale traffic, reduce the number of network devices, and power-related issues; and

  • A technical paper "Moving 10-gigabit Ethernet onto UTP: Moving 10GE into a Volume Platform," explains how to achieve 10 Gbps on copper UTP cabling and meeting the application's requirements for low power and much more.

An Alliance members meeting will also take place at DesignCon 2006 on Tuesday, February 7.

DesignCon is aimed at practicing engineers in the electrical design and semiconductor sectors. DesignCon 2005 hosted more than 110 exhibiting companies and drew nearly 5,000 industry professionals to register. This year over 100 sessions and tutorials and more than 200 industry speaks are anticipated to attract over 125 exhibiting companies and more than 6,000 industry professionals.

For more information visit: www.designcon.com/2006.

Richard Phelps , senior editor, Control Engineering





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