Capacitive accelerometer and LCC/JCC chip
Silicon Designs, Inc. announced the recent expansion of its offerings for automotive testing to include six new high-performance and low-cost model series.
Silicon Designs, Inc. announced the an expansion of its industrial-grade MEMS capacitive accelerometer chips to include six new high-performance and low-cost model series, as well as enhanced application suitability.
The MEMS capacitive accelerometer modules and LCC/JCC chips range from ± 2 g to ± 400 g, for zero-to-medium frequency instrumentation requirements. Module designs combine either a single axis model or three orthogonally block-mounted models within an epoxy seam-sealed anodized aluminum housing. The use of proprietary manufacturing technologies allows for onboard voltage regulation and an internal voltage reference, making the units relatively insensitive to temperature and voltage changes, while eliminating the need for external power amplification and regulation. Carefully regulated manufacturing processes ensure that each sensor is made to be virtually identical, allowing users to swap out modules with little or no modifications.
MEMS capacitive accelerometer technologies provide the necessary stability and performance reliability for critical automotive test requirements, including road load data acquisition (RLDA), crash sled testing, vehicle and component durability testing, ride quality and handling, and NVH testing.
– Edited by CFE Media. See more Control Engineering manufacturing IT, MES products.
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