Measurement science conference to focus on metrology, calibration

By Control Engineering Staff December 15, 2005

Challenges in metrology and calibration will be the focus of the upcoming Measurement Science Conference. More than a dozen technical sessions are planned, covering the current state of metrology, standards and practices, corporate process changes and the impact on the lab, and how managers can meet upcoming challenges. The 36thAnnual Conference is scheduled for the Disneyland Hotel, Anaheim, CA, Feb. 27-Mar. 3, 2006.

Key sessions include Metrology: the next 20 years , which will discuss the struggle between the benefits of calibration, its overhead expense, and market forces to drive down that expense. Other presentations will discuss how wireless connectivity and disposable sensors can increase productivity and reduce calibration- and maintenance-related workloads while increasing system availability and cutting costs. Future sensor-based networks will examine how future sensors, such as embedded and wireless types, must be able to support current-state technology and sensors of the past as well.

More information is available on the conference Web site .

—Jeanine Katzel, senior editor, Control Engineering,