Minneapolis, MN—PPT Vision Inc. has released two camera models, Impact T26 and T27, which it claims are the highest-resolution intelligent cameras in the machine vision industry.
Minneapolis, MN— PPT Vision Inc. has released two camera models, Impact T26 and T27, which it claims are the highest-resolution intelligent cameras in the machine vision industry. T26 and T27 are the latest additions to PPT’s Impact T-series, which have full-scale image processing capabilities built into the camera.
“Both cameras are designed to give manufacturers greater accuracy and improved defect detection, compared to standard resolution vision systems,” says Joe Christenson, PPT Vision’s president. “Impact T26 incorporates a 1,280 x 1,024 CMOS imager that provides an economical machine vision solution with all the features of a full-scale, high-resolution system. Impact T27 has a 1,600 X 1,200 CCD imager, and is ideal for the most accurate and repeatable defect detection, even at high production speeds.”
PPT adds that early intelligent cameras did not have the image processing horsepower or features of full-scale vision systems, and so they could only be used for simple applications. Introduced in 2004, Impact T-series includes high-resolution cameras, color cameras, micro-head models, and high performance software that reportedly provide cost effective solutions for tough machine vision applications.
Each member of the Impact T-series family contains a high-performance microprocessor and real-time operating system, plus a digital imaging sensor. The electronic components are contained into a sealed industrial unit, which can be installed directly into assembly lines and manufacturing equipment. A broad array of discrete, serial, and Ethernet I/O reportedly make Impact T-series compatible with industrial control equipment and instrumentation devices.
Both cameras are fully supported by PPT’s Inspection Builder software, which is an application developer package that uses icon-based programming and inspection algorithms, including pattern matching, blob analysis, sub-pixel gauging, and character inspection.
Control Engineering Daily News DeskJim Montague, news [email protected]
