National Instruments


Wireless May 23, 2017

Series of radio heads for transceiver system

National Instruments' (NI) series of 28 GHz radio heads for the mmWave Transceiver System creates a commercially available full transceiver that covers a spectrum from 27.5 GHz to 29.5 GHz.

By National Instruments
Energy Efficiency May 23, 2017

Core configurations for accelerated test systems

National Instruments' (NI) ATE Core Configurations are designed to deliver core mechanical, power, and safety infrastructure to help users accelerate the design and build of automated test systems.

By National Instruments
Ethernet May 23, 2017

Multislot Ethernet chassis for enhancing TSN

National Instruments' (NI) cDAQ-9185 and cDAQ-9189 multislot Ethernet chassis feature are designed to enhance time sensitive networking (TSN) and rugged CompactDAQ hardware for distributed measurements

By National Instruments
Cybersecurity January 11, 2017

Industrial Internet of Things lab opened

National Instruments announced the opening of the NI Industrial IoT (IIoT) lab at its Austin headquarters. The lab’s operational focus includes areas such as microgrid control and communication, advanced control for manufacturing, and asset monitoring for heavy equipment.

By National Instruments
Wireless August 30, 2016

Company announces CEO transition plan

National Instruments (NI) announced that its board of directors has elected Alex Davern to serve as chief executive officer (CEO) and president of National Instruments. He will be replacing Dr. James Truchard, who will remain as chairman of the board.

By National Instruments
Wireless August 4, 2016

MIMO application framework for 5G prototyping

National Instruments' LabVIEW multiple-input and multiple-output (MIMO) Application Framework is designed to enable researchers to build both traditional MIMO and massive MIMO prototypes for wireless applications working on 5G prototyping.

By National Instruments
Wireless August 4, 2016

Digital pattern instrument and editor for semiconductor test systems

National Instruments' NI PXIe-6570 digital pattern instrument and NI digital pattern editor are designed for manufacturers of RFICs, MEMS devices, and mixed-signal integrated circuits (ICs) from the closed architectures of conventional semiconductor automated test equipment (ATE).

By National Instruments
Simulators, Optimizers August 3, 2016

Hardware-in-the-loop simulators with open, modular architecture

National Instruments' turnkey Hardware-in-the-Loop (HIL) Simulators that are built on an open, modular architecture and are designed to help automotive and aerospace embedded software testers maintain quality.

By National Instruments
Virtualization, Cloud Analytics August 1, 2016

System design software for simplified development and software integration

National Instruments' (NI) LabVIEW 2016 system design software is designed to help engineers simplify development and integrate software from the ecosystem into their systems.

By National Instruments
Wireless August 6, 2015

Wireless test solution for manufacturing

National Instruments' Wireless Test System (WTS) is designed to lower the cost of high-volume wireless manufacturing test and multiply throughput on the production floor and allows manufacturers to improve instrument utilization when testing multiple devices in parallel.

By National Instruments
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