Digital pattern instrument and editor for semiconductor test systems

National Instruments' NI PXIe-6570 digital pattern instrument and NI digital pattern editor are designed for manufacturers of RFICs, MEMS devices, and mixed-signal integrated circuits (ICs) from the closed architectures of conventional semiconductor automated test equipment (ATE).
By National Instruments August 4, 2016

National Instruments' NI PXIe-6570 digital pattern instrument and NI digital pattern editor are designed for manufacturers of RFICs, MEMS devices, and mixed-signal integrated circuits (ICs) from the closed architectures of conventional semiconductor automNational Instruments’ (Nasdaq: NATI), NI PXIe-6570 digital pattern instrument and NI digital pattern editor are designed for manufacturers of radio frequency integrated circuits (RFICs), microelectromechanical system (MEMS) devices and mixed-signal integrated circuits (ICs) from the closed architectures of conventional semiconductor automated test equipment (ATE). The NI PXIe-6570 digital pattern instrument is designed to delivers the needed test capability for the ICs found in the wireless device supply chain and Internet of Things (IoT) devices. It features 100 MVector per second pattern execution with independent source and capture engines and voltage/current parametric functions at up to 256 synchronized digital pins in a single subsystem.

Users can take advantage of the openness of PXI and the semiconductor test system (STS) to add as many or as few devices as they need to meet the device pin and site counts required in the test configuration. The digital pattern editor software integrates editing environments for device pin maps, specifications and patterns to develop test plans faster; built-in tools like multisite and multi-instrument pattern bursting to expand from development into production.

National Instruments (NI)

www.ni.com 

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