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Process Manufacturing

Courtesy: Opto 22
IIoT, Industrie 4.0 April 7, 2020

An overview of industrial IoT, from edge to cloud

Next generation distributed I/O brings users one step closer to seamless connectivity

By Josh Eastburn
Courtesy: APC Performance LLC
Process Manufacturing April 4, 2020

Understanding multivariable control: The missing metric

Advanced process control: An improved understanding of the role of multivariable control in industrial process operations will lead to more cost-effective solutions and engage a wider circle of people in the process automation enterprise.

By Allan Kern
Courtesy of: ICONICS
Data Acquisition, DAQ March 27, 2020

Data visualization applications and trends

There are as many ways organizations can create, store, move and retrieve data as there are ways to see, perceive and interpret it

By Melissa Topp
CRB Slider
Simulators, Optimizers February 24, 2020

Process simulation benefits for manufacturers

Process simulation can be an invaluable tool to compare alternatives and justify the cost for manufacturing and manufacturing-related processes.

By Philip Lyman, PhD
Courtesy: MartinCSI
virtualization, Cloud, Analytics, Edge Computing April 2, 2020

Edge computing terms and skills

Six edge computing questions to ask about data collection, networking and control systems.

By Nate Kay, P.E.
Graduate student Zach Fredin operates the Zund large-format cutter in MIT’s Center for Bit and Atoms. The machine was used to make prototypes of the face shield. Courtesy: Center for Bits and Atoms, MIT
PPE April 2, 2020

University initiates mass manufacture of disposable face shields for COVID-19 response

An MIT team launched mass manufacturing of a new technique to meet the high demand for disposable face shields with a single-piece design that uses die cutting to create them quickly.

By Mary Beth Gallagher
Courtesy: Endress+Hauser
IIoT, Industrie 4.0 April 2, 2020

Deploy IIoT sensors and networks in remote locations

IIoT adds value within a plant, but also is a natural fit for field data gathering

By Ryan Williams